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Machine learning for metrology in manufacturing

  • Gisela Lanza*
  • , Robert Schmitt
  • , Wim Dewulf
  • , Hans Hansen
  • , Yang Zhang
  • , Benjamin Montavon
  • , Florian Stamer
  • *Corresponding author for this work

Research output: Journal contributionsJournal articlesResearchpeer-review

Abstract

Machine learning is transforming manufacturing metrology by enabling data-driven modeling, automation, and real-time decision-making across the measurement process. This keynote reviews recent advances and future directions for integrating machine learning (ML) throughout the measurement workflow—from system setup to decision-making—by structuring the analysis of the state of the art using a data flow framework. Key applications include ML-assisted setup and calibration, enhanced measurement, virtual measurements, and classification-based inspection. The remaining key challenge is the integration of metrological traceability, standardized uncertainty quantification, explainability, and reproducibility. Bridging the underlying conceptual gap in understanding and evaluating uncertainty is essential to establish scientifically rigorous and industrially reliable ML-driven metrology for future manufacturing systems.

Original languageEnglish
JournalCIRP Annals
Number of pages27
ISSN0007-8506
DOIs
Publication statusE-pub ahead of print - 15.05.2026

Bibliographical note

Publisher Copyright:
© 2026 The Authors. Published by Elsevier Ltd on behalf of CIRP. This is an open access article under the CC BY license. http://creativecommons.org/licenses/by/4.0/

Research areas and keywords

  • Machine learning
  • Manufacturing
  • Measurement
  • Uncertainty

ASJC Scopus Subject Areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

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