Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

A. P. Georgiadis; D. Apostolakis; M. Vourkas; Arthur J. Pape

doi:10.1016/0168-583X(90)90375-5

Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

A. P. Georgiadis^*
, D. Apostolakis
, M. Vourkas
, Arthur J. Pape

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beiträge in Zeitschriften › Konferenzaufsätze in Fachzeitschriften › Forschung › Begutachtung

Abstract

Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

Originalsprache	Englisch
Zeitschrift	Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Jahrgang	50
Ausgabenummer	1-4
Seiten (von - bis)	321-327
Seitenumfang	7
ISSN	0168-583X
DOIs	https://doi.org/10.1016/0168-583X(90)90375-5
Publikationsstatus	Erschienen - 03.04.1990
Extern publiziert	Ja
Veranstaltung	European Conference on Accelerators in Applied Research and Technology - 1989 - Johann Wolfgang Goethe-Universitat , Frankfurt, Deutschland Dauer: 05.09.1989 → 09.09.1989 Konferenznummer: 1

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Ingenieurwissenschaften

ASJC Scopus Sachgebiete

Instrumentierung
Kern- und Hochenergiephysik

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10.1016/0168-583X(90)90375-5

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title = "Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons",

abstract = "Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.",

keywords = "Engineering",

author = "Georgiadis, \{A. P.\} and D. Apostolakis and M. Vourkas and Pape, \{Arthur J.\}",

year = "1990",

month = apr,

day = "3",

doi = "10.1016/0168-583X(90)90375-5",

language = "English",

volume = "50",

pages = "321--327",

journal = "Nuclear Instruments \& Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms ",

issn = "0168-583X",

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number = "1-4",

note = "European Conference on Accelerators in Applied Research and Technology - 1989, ECAART ; Conference date: 05-09-1989 Through 09-09-1989",

}

Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. / Georgiadis, A. P.; Apostolakis, D.; Vourkas, M. et al.
in: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms , Jahrgang 50, Nr. 1-4, 03.04.1990, S. 321-327.

Publikation: Beiträge in Zeitschriften › Konferenzaufsätze in Fachzeitschriften › Forschung › Begutachtung

TY - JOUR

T1 - Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

AU - Georgiadis, A. P.

AU - Apostolakis, D.

AU - Vourkas, M.

AU - Pape, Arthur J.

N1 - Conference code: 1

PY - 1990/4/3

Y1 - 1990/4/3

N2 - Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

AB - Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

KW - Engineering

UR - https://www.scopus.com/pages/publications/45149135693

U2 - 10.1016/0168-583X(90)90375-5

DO - 10.1016/0168-583X(90)90375-5

M3 - Conference article in journal

AN - SCOPUS:45149135693

SN - 0168-583X

VL - 50

SP - 321

EP - 327

JO - Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

IS - 1-4

T2 - European Conference on Accelerators in Applied Research and Technology - 1989

Y2 - 5 September 1989 through 9 September 1989

ER -

Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

Abstract

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