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Machine learning for metrology in manufacturing

  • Gisela Lanza*
  • , Robert Schmitt
  • , Wim Dewulf
  • , Hans Hansen
  • , Yang Zhang
  • , Benjamin Montavon
  • , Florian Stamer
  • *Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beiträge in ZeitschriftenZeitschriftenaufsätzeForschungBegutachtung

Abstract

Machine learning is transforming manufacturing metrology by enabling data-driven modeling, automation, and real-time decision-making across the measurement process. This keynote reviews recent advances and future directions for integrating machine learning (ML) throughout the measurement workflow—from system setup to decision-making—by structuring the analysis of the state of the art using a data flow framework. Key applications include ML-assisted setup and calibration, enhanced measurement, virtual measurements, and classification-based inspection. The remaining key challenge is the integration of metrological traceability, standardized uncertainty quantification, explainability, and reproducibility. Bridging the underlying conceptual gap in understanding and evaluating uncertainty is essential to establish scientifically rigorous and industrially reliable ML-driven metrology for future manufacturing systems.

OriginalspracheEnglisch
ZeitschriftCIRP Annals
Seitenumfang27
ISSN0007-8506
DOIs
PublikationsstatusElektronische Veröffentlichung vor Drucklegung - 15.05.2026

Bibliographische Notiz

Publisher Copyright:
© 2026 The Authors. Published by Elsevier Ltd on behalf of CIRP. This is an open access article under the CC BY license. http://creativecommons.org/licenses/by/4.0/

ASJC Scopus Sachgebiete

  • Maschinenbau
  • Wirtschaftsingenieurwesen und Fertigungstechnik

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